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NEW PRODUCT

AES-4SD Flexible Device Analysis System

AES-4TH environment controlled probe test platform is especially suitable for application environment simulation test and comprehensive characteristic analysis of micron level materials or devices (sensors, detectors, transistors, etc.).

Industry News

  • Graphene Becomes Superconductive—Electrons with 'No Mass' Flow
  • Global Automotive MEMS Sensor Market Size
  • Hydroactuated Configuration Alteration of Fibrous Dandelion Pappi
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Papers

  • Vapor-Generation Methods for Explosives-Detection Research
  • Chemical Sensors
  • Ceramic Humidity Sensor
  • Carbon Nanotube Gas and Vapor Sensors
  • Black Phosphorus Gas Sensors
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New products

  • FE-SDT environment controllable flexible electronic test system
  • AES-4SD Flexible Device Analysis System
  • DGL-III Humidity-Controlled Liquid Distribution System
  • CGS-MT miro analysis system
  • SA6101 Electrical Analysis System
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